LUTIS TECH CO. LTD.

info@lutistech.com

Tel: +82(2)-861-8911

(Gasan-dong, Daesung D-polis Knowledge Industry Center),

326-ho, 606, Seobusaet-gil,Geumcheon-gu,Seoul,08504, Korea

Products

​All Products

Get a complete list of 22,573 devices supported by this programmer

​Fast In-system programming

Multi programming mode

​DLL control and scripts

Free lifetime software update

Two year warranty

ChipProg-ISP2

In-System Device Programmer

Extremely fast!

Program + verifies 1Gb NAND flash for 23s

​80,259 supported devices

ISP capability

DLL control and scripts

Free lifetime software update

​Two year warranty

ChipProg-481

Device Programmer

11 Haptic Keys are automatically detected by automatically measuring Fore and distance and time of Key
And you can display the results graphically so you can easily check it when you make a bad decision

The user can set the time and distance with each Force.

Haptic Key Tester

Automation Equipments

It is an equipment to inspect foreign objects, angle of view, focus, and optical axis of camera with ISO chart.

Camera Module Tester

Test Epuipment

Dual cannel PCI express frame grabber & MIPI 4-Lane interface

C-PHY and D-PHY combined interface 

EVDC2EX4G2 V1.0

PCI Express Frame Grabber

It can receive 6-lane, 2.5Gbps sensor signals from the Sony SLVS EC spec.

About sensors  I2C, SPI, I / O Volt, Clock, Reset, and GPIO signals.
 Receives the input of the sensor and transmits it to the frame grabber through the cable in

MIPI packet format.

EV-SLEC-PD-F

PMU Box

래그-1.png

The FORMULA® HF Ultra Test System is an ATE for functional and parametric testing of ultrahigh frequency VLSI circuits.

The applications for FORMULA® HF are quality control of VLSI circuits, testing and studies of newly developed types of VLSI circuits, and production monitoring for serial products.

The FORMULA® HF Ultra meets the requirements of metrological standards in measurement and testing in microelectronics.

FORMULA HF ULTRA TEST SYSTEM

form-2.png

FORMULA® TT3 Test Systems have been created to carry out highly reliable measurements of the parameters of semiconductor devices.

FORMULA® TT3 TEST SYSTEM