The FORMULA® HF Ultra Test System is an ATE for functional and parametric testing of ultrahigh frequency VLSI circuits.

The FORMULA® HF3 Test System is an ATE for functional and parametric testing of ultrahigh frequency VLSI circuits.

The FORMULA® 2K tester is an automated universal measurement and control system for the functional and parametric control of digital, analog and digital-analog microcircuits of small and medium integration, as well as memory microcircuits.

The FORMULA® TT3 Test System is a universal testing and measuring system designed for comprehensive automated verification of the static parameters of semiconductor device

The FORMULA® TT2 Test System is a Static parameter test and measurement of semiconductor devices such as transistors, stabilizer diodes, thyristors, diodes and photocouplers

The FORMULA® R Test System is an automated test and measuring system designed for comprehensive automated verification of the low-current DC electromagnetic relays with up to 8 coils and up to 12 contact groups.