The FORMULA® HF Ultra Test System is an ATE for functional and parametric testing of ultrahigh frequency VLSI circuits.

The applications for FORMULA® HF are quality control of VLSI circuits, testing and studies of newly developed types of VLSI circuits, and production monitoring for serial products.


The FORMULA® HF Ultra meets the requirements of metrological standards in measurement and testing in microelectronics.

The FORMULA® HF Ultra Test System is the flagship of our line of FORMULA® HF VLSI circuit high frequency test systems.


The FORMULA® HF Ultra Test System was created for reliable measurement and testing of a wide range of VLSI circuits.

The key technical characteristics of the ATE are

  • Number of universal bidirectional pins — up to 1024

  • Functional testing frequency — up to 550 MHz per pin

  • Precision generator reference frequency — 1200 MHz

  • Vector/error memory — up to 128 М/128 М vectors

  • DAC/ADC measurement unit — 1200 MOPS/24 bit

The FORMULA® HF Ultra Test System is a functionally complete automated means of measurement for VLSI circuits and provides:

  • High readiness of equipment for measurements and tests

  • Automation of all stages of the measurement process and data management

  • High-speed Multisite mode

  • Operating modes with automated probes, automatic loaders, test equipment and instruments

  • Reliability in round-the-clock operations

  • User-friendly, fully functional software

  • Quickly interchangeable test fixtures

  • Automatic diagnostics and metrological calibration

FORMULA® has modular bus architecture that implements the principle of custom configuration of equipment with a choice of primary and secondary devices corresponding to the range of measurement and testing tasks.














The function testing subsystem for 1024 channels with a frequency up to 550 MHz per channel includes:

  • A test pattern generator for functional testing of VLSI circuits

  • An algorithmic test pattern generator to test high-speed memory VLSI circuits and other regular logic

The characteristics of the FORMULA® HF Ultra functionaltesting subsystem enable its successful use in testing ultrahigh frequency VLSI circuits with up to 1600–1700 outputs, such as ASICs and FPGA.

A mode with simultaneous use of the test pattern generator and algorithmic test pattern generator is provided for testing of VLSI circuits by functional testing and algorithmic testing methods in a single measurement cycle.


The parametric measurement subsystem includes: A subsystem for reproduction and measurement of static electrical parameters with the following characteristics:

  • range of four-level signals reproduced, including differential signals, in the voltage range from –1.5 V to +13 V independently for each pin

  • ranges of measurement sources:


Ranges                                                           Sources                                                                                Quantity

   0…+6 В;                                                    ±250 μA … ±4 АVCC source and measure resource      32

–2…+15 В; ±200 nA … ±400 mA            VDD source and measure resource                                   32

–2…+13 В; ±200 nA …±150 mA             multipin parametric mesaurement units (PMU)             32

–2…+11 В; ±2 μA … ±32 mA                   per-pin parametric measurement units (PPMU)           1024

-17…+17 V; –500 mA…+500 mA              HVDD measurement sources                                             8

Special power supplies for high-power VLSI circuits (multicore microprocessors, FPGA and other microcircuits with high power consumption)

4.5 V/20 А                                                    LVDD high-power supplies                                                  2

3.5 V/50 А/100А                                        SPS power supply                                                                  1


The use of PPMUs enables Multisite mode for parallel high-speed testing of microcircuits on a wafer and in a package.

HVDD supplies can be used to program FLASH and ROM, as well as for testing analog microcircuits and operating amplifiers and comparators.


The precision subsystem for measurement of timing parameters of VLSI circuits enables measurement of the propagation time delay of a signal, pulse duration, rising edge and falling edge, as well as other timing characteristics of VLSI circuits with accuracy determined on the basis of the following characteristics:

  • Input Edge Placement Accuracy (IEPA) ±150 picosec

  • Output Edge Placement Accuracy (OEPA) ±250 picosec

  • Overall timing accuracy (OTA) ±250 picosec

  • Minimum duration of pulse rising and falling edge – (275±150) picosec


The subsystem is based on the ATE’s universal measurement pins.

Compensation of signal distortions in a reception/transmission cycle independently for each pin and programmable generation of the signal rising/falling edge slope in the range from 100% to 25%, which is programmed and implemented independently by pin, is provided to preserve the pulse waveform and the requirements for connection to the microcircuit being tested.




BIST technology

In view of the need among developers to perform in-circuit testing of VLSI circuits in the test model stage, the FORMULA® HF Ultra Test System can use BIST technology. A JTAG port integrated into the ATE that supports performance of all standard functions, including filling configuration files in FPGA, and also has an integrated JAM PLAYER with STAPL language support is used for this.


ARP DAC/ADC measurement unit

The FORMULA® Test System is equipped with a precision analog-digital unit for measurement of combined type microcircuits (DAC and ADC): 1200 MHz/1200 MOPS/(–10…+10) V, which enables measurement of timing and static conversion parameters of up to 14-bit highspeed ADC microcircuits when periodic signals with frequency up to 260 MHz are formed at their inputs, as well as measurement of the static onversion parameters of up to 16-bit low-frequency DAC and ADC microcircuits. The ARP unit includes the following functional devices:

















  • Precision two-pin clock pulse generator up to 1200 MHz

  • Random waveform signal generator with high-frequency and low-frequency pins and conversion frequency up to 1200 MOPS

  • Two precision 20/24-bit reference voltage sources with voltage range from –10 V to +10 V



The design, hardware and software of the FORMULA® HF Ultra Test System create optimum conditions for testing microcircuits, including for testing combined with measurements, for example, using ThermoStream units and flow climatic chambers.

Measurements under temperature effects directly on the spring base, without using cables, and without loss of signal quality are supported.

One of the priorities in the design of the system was to develop methods for the ATE to signal transmission back and forth to the device under test (DUT) with minimal signal loss and distortion.

An original new-generation contact system, designed for measurements under both normal conditions and in the temperature range from –60 °C to +125 °C, was developed especially for the FORMULA® HF Ultra Test System.



































Reliability, convenience, fast installation, and attachment and replacement of test fixtures are achieved by using a precision spring device, special frames for large test fixtures and POGO-PIN contacts that guarantee at least a million test fixture connections.

The ATE is equipped with means for integration with external equipment, including probes, test equipment and external instruments.

The measurement unit rotation manipulator has an electrical lead with electronic control, which provides optimum workstation ergonomics in all operating modes.



The design of the frames permits accessories of various dimensions.

The FORMULA® delivery package includes standard installation frames for test boards and complete documentation for independent development of accessories by the Client.


The design of the frames permits accessories of various dimensions.


So that FORMULA® HF Ultra Test System clients can more quickly achieve their business objectives and promptly see a return on investment, FORM offers both factory-ready and custom TestBox® Test Solutions for measuring specific types of microcircuits: under normal conditions and under the impact of extreme temperatures.

Each TestBox® Test Solution includes:

  • specialized test fixture for connecting a specific type of VLSI circuit

  • a disk with VLSI circuit test program

  • A data sheet with TestBox® operating manual

  • Manufacturer’s warranty


A group of experienced engineers at our testing laboratory develops designs and software for Test Solutions. The quality of TestBox® Test Solutions is the result of their correspondence to the regulations on ECB and electronic components, technical requirements and Client specifications

By purchasing the TestBox®, Clients can significantly reduce the time required to put their products on the market.

Today, more than 550 types of Test Solutions already developed are used by FORMULA® Test System Clients, providing consistent metrological support for quality control of electronic components.






To reduce the Client’s time and costs for support work, FORM offers the following technical services to FORMULA® HF Ultra Test System Clients:

  • Integration of FORMULA® HF Ultra Test Systems into the Client’s technological, informational and testing infrastructure, with connection of external equipment, instruments and IT networks

  • Scheduled maintenance, repair and metrological services at the place where the ATE is operated

  • Organization of workstations based on FORMULA® HF Ultra Test Systems with a database for ensuring traceability of measurements

  • Organization of workstations based on FORMULA® HF Ultra Test Systems with a database for ensuring traceability of measurements

  • Expansion of the ATE configuration according to a list of typical options, or with custom development of options


The FORMULA® HF Ultra Test System has modular bus architecture and allows for custom hardware and software configuration according to the design versions indicated in the type description of the means of measurement.

The configuration of each Test System is determined based on an analysis of the Client’s tasks, requirements and preferences, and is reflected in the Delivery Specification, as well as in the data sheet for each Test System.

The delivery set includes complete operating and metrological documentation and an initial calibration certificate.


FORMULA® Test System warranty service and maintenance in operations are provided by the developer and manufacturer, FORM.

The hardware warranty is 1 year and provides for free visits by engineers to the place where the ATE is operated for warranty repair and unscheduled metrological calibration.

At the end of the warranty period, FORM offers Clients a service contract and provides technical service and metrological service upon individual Client request.

The FORM technical support service provides FORMULA® Test System Clients with the following unlimited free services:

  • Consultation via telephone, email and fax, during terminal sessions, and directly at FORM premises

  • Methodological assistance in complaint analysis

  • Remote ATE diagnostics with fault detection

  • Updating of software versions

  • Arranging for maintenance and repair

  • Information on new ATE options and new Test Solutions


The FORMULA® HF Ultra Test System delivery time is from 9 to 15 weeks depending on the configuration.

The cost includes:

  • 1 year warranty

  • Delivery to the Client’s address, with installation and connection of the ATE on the Client’s premises

  • Client personnel training on rules for FORMULA® ATE operation and development of test programs

  • Commissioning of Test System with application of TestBox® Test Solutions.